Publications / Patents

                                          P u b l i c a t i o n s

                                          Most Recent Shanghai Jiaotong University, 2013-2019:

                                          材琌硄讯论ゅ9絞
                                          [1]. Franklin Li Duan, Zhi Yang, Zhonglin Ji, Haotian Weng, Ziyi Xie, Allegro Shen, Shijie Mi, Xi Chen, Yigang Chen, Qianhui Liu, Process optimization and device variation of Mg-doped ZnO FBARs, Solid-State Electronics, Volume 151, 2019, Pages 11-17, ISSN 0038-1101.
                                          [2]. Duan Franklin Li, Hu M, Zou B, et al. An Easy Way of High-Temperature Monitoring of Turbine Blade Surface for Intelligent Propulsion Systems[C]// Joint Propulsion Conference. 2018.
                                          [3]. Franklin L. Duan, Mingkai Hu, Yuzhen Lin, Jibao Li, and Xueqiang Cao. "A New High-Temperature Sensing Device by Making Use of TBC Thermistor for Intelligent Propulsion Systems", 2018 AIAA/IEEE Electric Aircraft Technologies Symposium, AIAA Propulsion and Energy Forum, (AIAA 2018-5015) https://doi.org/10.2514/6.2018-5015
                                          [4]. Franklin L. Duan and Yuzhen Lin. "Development of Accurate and Robust High Temperature Sensor on Aero-engine Turbine Blade Surface", 2018 Joint Propulsion Conference, AIAA Propulsion and Energy Forum, (AIAA 2018-4622). https://doi.org/10.2514/6.2018-4622
                                          [5]. Franklin Li Duan, Jibao Li, Junchao Gao, Guifu Ding, and Xueqiang Cao. "Integrated Fabrication of High-Temperature Microelectromechanical System Sensor on Aeroengine Turbine Blade", Journal of Thermophysics and Heat Transfer, Vol. 32, No. 3 (2018), pp. 828-830. https://doi.org/10.2514/1.T5147
                                          [6]. Franklin L. Duan. "High Temperature Sensors for Intellegent Aero-Engine Applications", 33rd AIAA Aerodynamic Measurement Technology and Ground Testing Conference, AIAA AVIATION Forum, (AIAA 2017-3239), https://doi.org/10.2514/6.2017-3239
                                          [7]. 琿卢学▆丽お璣学Θう凤↙军,℉玦ぱ张亚獶て锌╰痢饯蔨声猧谐竟㎝┦┖ [J]. 稬纳电м术, 2016(11):333-339.
                                          [8]. 琿, 蔼А禬, ↙风军, 璊铭发, 苏箃禬, & Θ睲睲单. (2017). 发动审叶热毁襖层温だガラ痷だ猂.ユ硄学学报,51(8), 915-920.
                                          [9]. 琿蔼А禬╦箃をΘ龙℉狽静猧.发动审涡轮叶栋Θ蔼温MEMS 传稰竟 发动审,2018,44(4):56-60


                                          硄讯论ゅ8絞
                                          [1]. Junchao Gao, Franklin Li Duan, Chang Yu, Wentao Meng, Lizuo Liu, Guifu Ding, Congchun Zhang, Ying Wang, Electrical insulation of ceramic thin film on metallic aero-engine blade for high temperature sensor applications, Ceramics International, Volume 42, Issue 16, December 2016, Pages 19269-19275, ISSN 0272-8842, http://dx.doi.org/10.1016/j.ceramint.2016.09.093.
                                          [2]. Mingkai Hu, Franklin Li Duan, Design, fabrication and characterization of SAW devices on LiNbO3 bulk and ZnO thin film substrates, Solid-State Electronics, Volume 150, 2018, Pages 28-34, ISSN 0038-1101, https://doi.org/10.1016/j.sse.2018.08.005. (http://www.sciencedirect.com/science/article/pii/S0038110118300509) Keywords: SAW device; Surface acoustic wave; Wireless sensor; RF resonator; Temperature sensor
                                          [3]. Yijian Liu, Zhongli Li, Zhi Yang, Yanjie Su, Yaozhong Zhang, Huey-liang Hwang, Franklin Duan**, Yafei Zhang*. Novel design and performance of the solidly mounted resonator with an AlN-buffered ZnO piezoelectric film [J]. Vacuum, 154 (2018) 11-17.
                                          [4]. Jin S, Li Duan, Qiang W, et al. Fabrication and High Temperature Characterization by MEMS Embedded Sensor[J]. Chinese Journal of Sensors & Actuators, 2017, 30(9):1352-1358.
                                          [5]. 経, 琿, 华, 马紈, おネ, & 吵闻钟单. (2017). 应ノ发动审涡轮叶热毁襖层╯.48 (2), 2084-2090.
                                          [6]. 箃, 琿, 璊铭发, ╦, をΘ龙, & ℉狽单. (2018). Mems栋Θ传稰竟动冲击试验╯.动.测试蒓诊断(3).
                                          [7]. 璊铭发 ぱ 刘骏尘 学Θ 丽お ╦ 张亚獶 琿. 设计㎝艺参数对声猧竟ン┦紇响 稬纳电м术, 2017, 54(11):752-759.
                                          [8]. 蔼А禬琿璣刘凤う╦↙红祘涤吴凯畃强郑箃谢开ΘPDMS软质家狾备蒓叶Ρ图转簿艺稬纳电м2016.5


                                          琂獶材獶硄讯论ゅ10絞
                                          [1]. Yijian Liu, Yong Shen, Franklin Duan, Yaozhong Zhang, Zhongli Li, Huey-liang, Hwang, Yafei Zhang, Solidly mounted resonators fabricated for GHz frequency applications based on MgxZn1-xO piezoelectric film, Vacuum, Volume 141, 2017, Pages 254-258, ISSN 0042-207X, https://doi.org/10.1016/j.vacuum.2017.04.012.
                                          [2]. J. Han, P. Cheng, H. Wang, C. C. Zhang, J. B. Zhang, Y. Wang, L. Duan and G. F. Ding, ¨MEMS-based Pt film temperature sensor on alumina substrate〃, J. Materials. Letters, 125(2014) 224-226.
                                          [3]. Liu Y, Shen Y, Duan F, et al. Solidly mounted resonators fabricated for GHz frequency applications based on Mg x Zn 1-x O piezoelectric film[J]. Vacuum, 2017, 141.
                                          [4]. Yafei Zhang, Li Franklin Duan, Yaozhong Zhang, Jian Wang, Huijuan Geng, Qing Zhang, Advances in Conceptual Electronic Nanodevices based on 0D and 1D Nanomaterials, Nano-Micro Letters 2014, 6, 119.
                                          [5]. 瑇, 孙お甊, 琿, 艳, ╦, 张賧, 瓆蔼温蝋层饯结疼传稰竟热审瘪綼┦ 仪м术蒓传稰竟 201511戳
                                          [6]. ℉玦, 刘剑, 杨揩狶, 琿, & 张亚獶. (2014). Mg_xzn_(1-x)o压电痢饯彩罻对smr┦紇响. 稬纳电м术(12), 776-779..
                                          [7]. 陈揩, 琿, 丽华. 销矗蔼瑈瞯亚だ侩瞯辅图OPCよ猭[J]. 2016.
                                          [8]. 陈权, 琿, を醇矯. 亚だ侩瞯辅图对28纳μ盞栋线条ㄨΘ钩紇响[J]. い国栋Θ电隔, 2016, 25(5).
                                          [9]. 许贻宾, 琿, & 钱ゅネ. (2017). 膀0.18m cmos艺实现无epi穝ldmos竟ン. 栋Θ电隔应ノ,34(4), 62-67.
                                          [10]. 变礰 琿,0.11°0.18um 导蔨硑IMD 蒩獁秆决よ. 栋Θ电隔应ノ,材35材12戳总材303戳201812る


                                          OldSilicon Valley, LSI and AMD:

                                          ²  Franklin Duan, Stephen Cooper, Amit Marathe, John Zhang, Sankaran Kartik Jayanarayanan. "Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests", IIRW2006.

                                          ²  F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, and S. Ramesh, LSI Logic Corporation, "Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability", ISQED'2003, pp119-124, 2003

                                          ²  Chuanzhao Yu, J. Zhang, J. S. Yuan, F. Duan, S. K. Jayanarananan, A. Marathe, S. Cooper, V. Pham, and J.-S. Goo, I, "Evaluation of RF Capacitance Extraction for Ultrathin Ultraleaky SOI MOS Devices", EEE ELECTRON DEVICE LETTERS, VOL. 28, NO. 1, JANUARY 2007

                                          ²  W. Kong, R.Venkatraman, R. Castagnetti, F. Duan and S. Ramesh, "High-Density and High-Performance 6T-SRAM for System-on-Chip in 130 nm CMOS Technology", VLSI Symposium, 2001.

                                          ²  Puchner, H.; Liu, Y.-C.; Kong, W.; Duan, F.; Castagnetti, R.; , "N-Well Engineering to Improve Soft-Error-Rate Immunity for P-Type Substrate SRAM Technologies," Solid-State Device Research Conference, 2001. Proceeding of the 31st European , vol., no., pp. 295- 298, 11-13 September 2001,

                                          ²  Venkatraman, R.; Castagnetti, R.; Kobozeva, O.; Duan, F.L.; Kamath, A.; Sabbagh, S.T.; Vilchis-Cruz, M.A.; Liaw, J.J.; Jyh-Cheng You; Ramesh, S.; , "The design, analysis, and development of highly manufacturable 6-T SRAM bitcells for SoC applications," Electron Devices, IEEE Transactions on , vol.52, no.2, pp. 218- 226, Feb. 2005.

                                          ²  Olga Kobozeva, Ramnath Venkatraman, Ruggero Castagnetti, Franklin Duan, Arvind Kamath and Shiva Ramesh, "Designing high-performance cost-efficient embedded SRAM in deep-submicron era", Proc. SPIE 5379, 241 (2004);

                                          ²   

                                          Previous Ph. D Period

                                          ²  Duan, F.L.; Ioannou, D.E.; Jenkins, W.C.; Hughes, H.L.; Liu, M.S.T.; , "Channel coupling imposed tradeoffs on hot carrier degradation and single transistor latch-up in SOI MOSFETs," Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International , vol., no., pp.194-202, March 31 1998-April 2 1998,

                                          ²  Ioannou, D.E.; Duan, F.L.; Sinha, S.P.; Zaleski, A.; , "Opposite-channel-based injection of hot-carriers in SOI MOSFET's: physics and applications," Electron Devices, IEEE Transactions on , vol.45, no.5, pp.1147-1154, May 1998

                                          ²  Ioannou, D.E.; Duan, F.L.; Jenkins, W.C.; Hughes, H.L.; , "Channel Coupling and Edge Effect Imposed Trade-offs on Fully-Depleted (FD) SOI MOSFET's," Solid-State Device Research Conference, 1998. Proceeding of the 28th European , vol., no., pp.616-619, 8-10 Sept. 1998,

                                          ²  Dimitris E. Ioannou, Franklin L. Duan, Williams C. Jenkins, and Harold L. Hughes, ¨Channel Coupling Imposed Tradeoffs on Fully-Depleted (FD) SOI MOSFETˇs〃, ESSDRECˇ98.

                                          ²  Franklin L. Duan, Dimitris E. Ioannou, Shankar P. Sinha, and Frederick T. Brady,  ¨LDD Design Tradeoffs for Self Latch-Up and Hot Carrier Degradation Control in Accumulation Mode FD SOI MOSFETˇs〃, IEEE Transactions on Electron Devices, vol. 44, pp.972-977, 1997.

                                          ²  F.L. Duan, X.Zhao, D.E. Ioannou, H.L. Hughes and S.T. Liu, ¨Detrimental Edge Effects on the Floating Body Phenomena in SOI MOSFETs〃, Symposium of 192nd International Meeting of the Electrochemical Society, Inc., pp.239-245, 1997.

                                          ²  Franklin L. Duan and Dimitris E. Ioannou, ¨Design and Analysis of a Novel Mixed Accumulation/Inversion Mode FD SOI MOSFET〃, 1997 IEEE International SOI Conference Proceedings, pp.100-101, 1997.

                                          ²  D.E. Ioannou, F.L. Duan, and X. Zhao, ¨SIMOX Substrate and MOSFETˇs for Enhanced Reliability and Performance〃, 1997 International Semiconductor Device Research Symposium, pp.627-630, 1997.

                                          ²  X. Zhao, F.L. Duan, A. Thanailakis, D.E. Ioannou, R.K. Lawrence, and H.L. Hughes, ¨Hole Trap Investigation in Supplemental Oxygen SIMOX Wafers by Opposite Channel Based Charge Injection〃, 1997 IEEE International SOI Conference Proceedings, pp.116-117, 1997.

                                          ²  Shankar P. Sinha, Franklin L. Duan, Dimitris E. Ioannou, William C. Jenkins, and Harold L. Hughes, ¨Time Dependence Power Laws of Hot Carrier Degradation in SOI MOSFETˇs〃, 1996 IEEE International SOI Conference Proceedings, pp.18-19, 1996.

                                          S. P. Sinha, F.L. Duan, D.E. Ioannou, William C. Jenkins, Harold L. Hughes, and M.S. Liu, ¨Hot Carrier Degradation of Fully Depleted SIMOX MOSFETˇs〃, Proceedings of the 7th International Symposium On Silicon-On-Insulator Technology and Devices, pp.324-329, 1996.

                                          P a t e n t s 专

                                          ²  Reduced soft error rate (SER) construction for integrated circuit structures, 2002

                                          ²  Single channel four transistor SRAM, 2002

                                          ²  A new method to detect random and systematic transistor degradation for transistor reliability evaluation in high-density memory  2003

                                          ²  Method and apparatus for characterizing shared contacts in high-density SRAM cell design  2003

                                          ²  New methodology to measure many more transistors on the same test area  2007

                                           


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                                          Links:

                                          Puchner, H.; Liu, Y.-C.; Kong, W.; Duan, F.; Castagnetti, R.; , "N-Well Engineering to Improve Soft-Error-Rate Immunity for P-Type Substrate SRAM Technologies," Solid-State Device Research Conference, 2001. Proceeding of the 31st European , vol., no., pp. 295- 298, 11-13 September 2001
                                          doi: 10.1109/ESSDERC.2001.195259
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1506641&isnumber=32281

                                          Yu, C.; Zhang, J.; Yuan, J. S.; Duan, F.; Jayanarananan, S. K.; Marathe, A.; Cooper, S.; Pham, V.; Goo, J.-S.; , "Evaluation of RF Capacitance Extraction for Ultrathin Ultraleaky SOI MOS Devices," Electron Device Letters, IEEE , vol.28, no.1, pp.45-47, Jan. 2007
                                          doi: 10.1109/LED.2006.886413
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4039573&isnumber=4039542



                                          ======================

                                          Venkatraman, R.; Castagnetti, R.; Kobozeva, O.; Duan, F.L.; Kamath, A.; Sabbagh, S.T.; Vilchis-Cruz, M.A.; Liaw, J.J.; Jyh-Cheng You; Ramesh, S.; , "The design, analysis, and development of highly manufacturable 6-T SRAM bitcells for SoC applications," Electron Devices, IEEE Transactions on , vol.52, no.2, pp. 218- 226, Feb. 2005
                                          doi: 10.1109/TED.2004.841346
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1386591&isnumber=30185

                                          Sinha, S.P.; Duan, F.L.; Ioannou, D.E.; Jenkins, W.C.; Hughes, H.L.; , "SOI-specific hot-hole induced degradation in PD and FD transistors ," SOI Conference, 1995. Proceedings., 1995 IEEE International , vol., no., pp.76-77, 3-5 Oct 1995
                                          doi: 10.1109/SOI.1995.526468
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=526468&isnumber=11594

                                          Duan, F.L.; Zhao, X.; Ioannou, D.E.; , "Increased channel edge impact ionization in SOI MOSFET's and effects on device operation," SOI Conference, 1998. Proceedings., 1998 IEEE International , vol., no., pp.171-172, 5-8 Oct 1998
                                          doi: 10.1109/SOI.1998.723166
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=723166&isnumber=15630

                                          Zhao, X.; Duan, F.L.; Thanailakis, A.; Ioannou, D.E.; Lawrence, R.K.; Hughes, H.L.; , "Hole trap investigations in supplemental oxygen SIMOX wafers by opposite channel based charge injection," SOI Conference, 1997. Proceedings., 1997 IEEE International , vol., no., pp.116-117, 6-9 Oct 1997
                                          doi: 10.1109/SOI.1997.634960
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=634960&isnumber=13782

                                          Duan, F.L.; Sinha, S.P.; Ioannou, D.E.; Brady, F.T.; , "LDD design tradeoffs for single transistor latch-up and hot carrier degradation control in accumulation mode FD SOI MOSFET's," Electron Devices, IEEE Transactions on , vol.44, no.6, pp.972-977, Jun 1997
                                          doi: 10.1109/16.585553
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=585553&isnumber=12670

                                          Sinha, S.P.; Duan, F.L.; Ioannou, D.E.; Jenkins, W.C.; Hughes, H.L.; , "Time dependence power laws of hot carrier degradation in SOI MOSFETS," SOI Conference, 1996. Proceedings., 1996 IEEE International , vol., no., pp.18-19, 30 Sep-3 Oct 1996
                                          doi: 10.1109/SOI.1996.552472
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=552472&isnumber=11984

                                          Duan, F.L.; Ioannou, D.E.; Jenkins, W.C.; Hughes, H.L.; Liu, M.S.T.; , "Channel coupling imposed tradeoffs on hot carrier degradation and single transistor latch-up in SOI MOSFETs," Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International , vol., no., pp.194-202, March 31 1998-April 2 1998
                                          doi: 10.1109/RELPHY.1998.670542
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=670542&isnumber=14724

                                          Ioannou, D.E.; Duan, F.L.; Sinha, S.P.; Zaleski, A.; , "Opposite-channel-based injection of hot-carriers in SOI MOSFET's: physics and applications," Electron Devices, IEEE Transactions on , vol.45, no.5, pp.1147-1154, May 1998
                                          doi: 10.1109/16.669576
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=669576&isnumber=14610

                                          Ioannou, D.E.; Duan, F.L.; Jenkins, W.C.; Hughes, H.L.; , "Channel Coupling and Edge Effect Imposed Trade-offs on Fully-Depleted (FD) SOI MOSFET's," Solid-State Device Research Conference, 1998. Proceeding of the 28th European , vol., no., pp.616-619, 8-10 Sept. 1998
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1503627&isnumber=32252


                                          Duan, F.; Cooper, S.; Marathe, A.; Zhang, J.; Jayanarayanan, S.K.; , "Impact of Monitoring Voltage on the Lifetime Extrapolation During the Accelerated Degradation Tests," Integrated Reliability Workshop Final Report, 2006 IEEE International , vol., no., pp.139-141, Oct. 16 2006-Sept. 19 2006
                                          doi: 10.1109/IRWS.2006.305229
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4098706&isnumber=4079457

                                          Puchner, H.; Liu, Y.-C.; Kong, W.; Duan, F.; Castagnetti, R.; , "N-Well Engineering to Improve Soft-Error-Rate Immunity for P-Type Substrate SRAM Technologies," Solid-State Device Research Conference, 2001. Proceeding of the 31st European , vol., no., pp. 295- 298, 11-13 September 2001
                                          doi: 10.1109/ESSDERC.2001.195259
                                          URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1506641&isnumber=32281


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